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非线性模拟电路可测试性度量研究

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模拟电路的可测试性度量是指导其进行可测试性设计的基础，针对目前非线性模拟电路可测试性分析过程复杂，无法量化的问题，在深入研究模拟电路可测试性度量和非线性模拟电路特性的基础上，利用分段线性方法将非线性模拟电路近似等效为线性模拟电路，并给出了非线性模拟电路可测试性度量的计算方法，极大拓宽了可测试性度量的应用范围；最后通过实例详细讲解了计算过程，并利用模拟电路可测试性度量的定义验证了该结果的有效性，该方法计算量小，不受容差影响，对非线性模拟电路可测试性研究具有一定的指导意义。

Testability measurement of analog circuit is the base of design for testability, for overcoming the problem that testability anal- ysis is perplexed, and can＇ t be quantified, based on the study of testability measure of analog circuit and the characteristic of nonlinear ana- log circuit, using the piecewise linear method to analyze nonlinear analog circuit, the method of nonlinear analog circuit testability measure is presented, introduce the process of calculation through a example, and use the definition of the testability measurement verify the validity of the results. This method expands greatly the application range of testability measure, and has a positive significance for the testability design...