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CMOS锁相环中鉴频鉴相器的研究
资料介绍
针对已有鉴频鉴相器电路鉴相范围小、死区大的缺点,设计了一种应用于锁相环中的鉴频鉴相器。采用0.25μm的互补金属氧化物半导体(CMOS)工艺,利用Tanner EDA软件设计了一款以逻辑门电路实现的D触发器为单元电路的鉴频鉴相器,并利用T-spice进行了仿真。仿真结果表明,该鉴频鉴相器消除了鉴相死区,鉴相范围为(-1.958π,+1.958π),最大工作频率为238MHz,可实现鉴频鉴相功能。
A phase-frequency detector is designed for the CMOS phase-locked loop circuit in order to overcome the problem of small range and large dead zone existing in the phase-frequency detector (PFD) circuits. The PFD is composed by D Flip-Flop unit circuit based on logic gates using Tanner EDA and 0.25 μm complementary metal-oxide-semiconductor (CMOS) transistor technology. Simulations are per- formed by T-spice software. The results show that the PFD proposed will eliminate the dead-zone with the phase ranges as ( - 1. 958π, + 1. 958π) and the maximum operating frequency as 238 MHz.
部分文件列表
文件名 | 大小 |
CMOS锁相环中鉴频鉴相器的研究.pdf | 851K |
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