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飞控用MOS TPN2R203NC 技术手册

更新时间：2019-08-12 10:29:38 大小：235K 上传用户：CRKJ168查看TA发布的资源 标签：mos 下载积分：2分 评价赚积分 （如何评价?） 打赏 收藏 评论(0) 举报

资料介绍

KOA Speer Electronics, . MOS1LT52R203J reduced size metal oxide power type leaded resistor Toshiba Semiconductor TPN2R203NC MOSFETs Silicon N-channel MOS 

部分文件列表

文件名 大小
TPN2R203NC_datasheet_en_20140218.pdf 235K

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TPN2R203NC  
MOSFETs Silicon N-channel MOS (U-MOS)  
TPN2R203NC  
1. Applications  
•
Power Management Switches  
2. Features  
(1) Low drain-source on-resistance: RDS(ON) = 1.8 mΩ (typ.) (VGS = 10 V)  
(2) Low leakage current: IDSS = 10 µA (max) (VDS = 30 V)  
(3) Enhancement mode: Vth = 1.3 to 2.3 V (VDS = 10 V, ID = 0.5 mA)  
3. Packaging and Internal Circuit  
1, 2, 3: Source  
4: Gate  
5, 6, 7, 8: Drain  
TSON Advance  
4. Absolute Maximum Ratings (Note) (Ta = 25 unless otherwise specified)  
Characteristics  
Symbol  
Rating  
Unit  
Drain-source voltage  
Gate-source voltage  
Drain current (DC)  
Drain current (DC)  
Drain current (pulsed)  
Power dissipation  
Power dissipation  
Power dissipation  
VDSS  
VGSS  
ID  
30  
±20  
100  
45  
V
V
(Silicon limit)  
(Tc = 25 )  
(t = 1 ms)  
(Note 1), (Note 2)  
(Note 1)  
A
ID  
A
(Note 1)  
IDP  
PD  
200  
42  
A
(Tc = 25 )  
(t = 10 s)  
W
W
W
mJ  
A
(Note 3)  
(Note 4)  
(Note 5)  
PD  
1.9  
(t = 10 s)  
PD  
0.7  
Single-pulse avalanche energy  
Avalanche current  
EAS  
IAR  
Tch  
Tstg  
126  
45  
Channel temperature  
Storage temperature  
150  
-55 to 150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Start of commercial production  
2013-05  
2014-02-18  
Rev.2.0  
1

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