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集成电路边界扫描测试系统中测试方式选择模块的电路设计
资料介绍
集成电路规模的不断增加,使测试的开销在产品总成本中所占的比重越来越大,测试的过程更为复杂,因此对电路芯片需要采用边界扫描测试进行可测性设计。对边界扫描控制器中的测试方式选择TMS模块的功能进行了详细说明,给出了该模块的电路设计方法与步骤。通过与测试软件的结合,能检测芯片间互连线的开路故障、短路故障、固定型故障,以及芯片的内部逻辑功能是否正常。
The increasing scale of integrated circuits makes that the cost of the testing process is increasing in the proportion of the total cost of the product. The testing process of chip is more complex, therefore it is needed to adopt the boundary scan testing which is one of design for testability. The function of test mode selection module in boundary scan controller is demonstrated in this paper, the circuit design method and procedure are given. The combination of boundary scan controller and testing software can detect the open faults, bridge faults, stuck-at faults, and can detect the internal logic function of the chips.
部分文件列表
| 文件名 | 大小 |
| 集成电路边界扫描测试系统中测试方式选择模块的电路设计.pdf | 387K |
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