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Standard Test Data Format
资料介绍
As the ATE industry matures, many vendors offer networking systems that complement the test
systems themselves and help customers get more out of their ATE investment. Many of these
networking systems are converging on popular standards, such as Ethernet.
A glaring hole in these standards has been the lack of test result data compatibility between test
systems of different manufacturers, and sometimes within the product lines of a single manufacturer.
In order tohelp overcome this problem, Teradyne has developed a simple, flexible, portable data format
to which existing data files and formats can be easily and economically converted. Called the Standard
Test Data Format (STDF), its specification is contained in the following document.
It is our hope that both users and manufacturers of semiconductor ATE will find this standard useful,
and will incorporate it into their own operations and products. Teradyne has adopted this standard for
the test result output of all of its UNIX operating system based testers, and offers conversion
software for users of its Test System Director for our other semiconductor test systems. Teradyne
derives no direct commercial benefit from propagating this standard, but we hope its usefulness,
thoroughness, and full documentation will make all of us who work with ATE more productive.
部分文件列表
| 文件名 | 大小 |
| std-spec.pdf | 775K |
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