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基于ISO14443A协议的RFID集成电路芯片测试系统的研究设计分析
资料介绍
基于ISO14443A协议的RFID集成电路芯片测试系统的设计研究对改善当前ATE的高成本、性能浪费等现象有积极意义。基于ISO14443A协议，利用RFID集成电路芯片设计了一个系统，从软硬件两个方面进行设计调试，并配合优化方案解决设计问题，最终结果表明设计系统运行效果佳，稳定性好，对于工业集成电路芯片测试系统的研究有一定价值。
Design of RFID integrated circuit chip testing system based on ISO14443A protocol has a positive significance for eliminating the high cost and performance waste phenomena of current ATE. A system was designed by means of ISO14443A protocol and RFID integrated circuit chip. In the design process,the design debugging of the hardware and software was conducted, and some design problems were solved by the aid of the optimization scheme. The final results show that the system works well and has high stability. It has a certain value for the research of the industry integrated circuit chip testing system.
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| 文件名 | 大小 |
| 基于ISO14443A协议的RFID集成电路芯片测试系统的研究设计分析.pdf | 197K |
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