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基于应变片的应力测量电路分析
资料介绍
文章分析了一种基于电阻应变片的应力测量理论测量电路。为降低实际测量中环境温度对测量结果的影响,文章进一步研究了测量电路的温度补偿措施。文中将理论应力测试和温度补偿方法相结合,给应力测试的实际操作提供了一套具有较高参考价值思路。
In this paper, a theoretical measurement circuit of stress measurement based on resistance strain gauge is analyzed. In order to reduce the influence of ambient temperature on the measurement results, the temperature compensation measures of the measuring circuit are further studied in this paper. In this paper, the combination of theoretical stress measurement and temperature compensation method provides a set of ideas with reference value for the practical operation of stress testing.
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| 文件名 | 大小 |
| 基于应变片的应力测量电路分析.pdf | 840K |
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