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基于Ultra—FLEX测试系统的集成电路测试开发

更新时间:2020-09-05 11:01:37 大小:456K 上传用户:xiaohei1810查看TA发布的资源 标签:测试系统集成电路 下载积分:5分 评价赚积分 (如何评价?) 打赏 收藏 评论(0) 举报

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在半导体技术高速发展的今天,对集成电路的测试要求越来越高,测试开发的难度、复杂度都在增加,如何应对当前集成电路的测试需求,成为测试开发者需要考虑的问题。Ultra-FLEX测试系统是新一代的测试系统,用以应对当今的测试需求。文章介绍了Ultra-FLEX测试系统的硬件资源,列举了部分模块及其功能和参数;描述了一般集成电路测试开发的流程,并以数字集成电路为例介绍了相关测试内容;介绍了Ultra—FLEX测试系统的软件环境,列举了测试程序构成要素以及各自功能;介绍了Ultra—FLEX测《试系统的程序调试环境,测试系统提供的调试工具以及调试方法。

Today, as the semiconductor technology is developing very fast, it requires high level testing, testing development becomes more difficult, more complex, how to satisfy the testing requirement is a question which testing developer need to think. Ultra-FLEX is a new generation test system which is used to test current integrated circuit. This article introduce the hardware of Ultra-FLEX, list some of the options and their function and parameter; describe the general procedure of testing development, and introduce the testing items of digital IC as example; introduce the software environment of Ultra-FLEX, list the content of a testing program and their function; intro...

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基于Ultra—FLEX测试系统的集成电路测试开发.pdf 456K

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