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红外线阵探测器筛选电路的设计与研究
资料介绍
为保证航天任务中短波红外线阵探测（SWIR）的可靠性与稳定性，本文针对Xenics公司的商用短波红外线阵探测器，设计了可同时进行10片探测器老炼的筛选测试系统电路。采用老炼前测试参数，老练过程中记录感光数据及老练后参数测试比对的方法筛选剔除出不合格器件。通过演示样机在暗室环境下对积分球亮度的调节进行探测器的感光参数测试，试验结果表明，器件完全满足可靠性筛选方法的要求。本文中筛选电路的设计方法对其他航天任务中的低等级器件筛选也具有一定的参考价值。
In order to make ensure the reliability and stability of short wave infrared detector in space mission, in this paper a test system which can screen 10 devices manufactured by Xenics simultaneously was designed.To find out unqualified devices, three steps are carried out, consisting of parameters test before burn-in process, photosensitive property test during the burn-in process anti parameters test after burn-in process.The parameters test are carried out by adjusting the brightness of integrating sphere in darkroom, and the shows the devices meet the requirements of reliability screening method.The design of screening circuit has a certain value for screening other low-level devices in other space missions.
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| 文件名 | 大小 |
| 红外线阵探测器筛选电路的设计与研究.pdf | 695K |
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