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一种FPGA单粒子软错误检测电路设计
资料介绍
分析了FPGA器件发生单粒子效应的空间分布特性,设计并实现了一种面向FPGA单粒子软错误的检测电路.将该电路放置在FPGA待检测电路的附近,利用单粒子效应的空间特性,则可以根据检测模块的状态变化,获得待检测电路发生单粒子软错误的情况. 仿真实验表明,该电路是可行、有效的检测电路,具有很小的资源和性能损失.
A detection circuit was designed and implemented by analyzing the spatial distribution characteristic of FPGA while the single event effect (SEE) happens. When the proposed circuit is placed close to the FPGA circuit that needs to be detected, it can detect the FPGA status changes due to the spatial feature of SEE, and then achieve whether the soft errors happen or not. The simulation experiments show that the designed circuit is feasible and effective. In addition, this detection circuit has very little resources and performance loss.
部分文件列表
文件名 | 大小 |
一种FPGA单粒子软错误检测电路设计.pdf | 538K |
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