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AOI检测系统的光源照明模式和控制电路设计
资料介绍
针对在不同照明方式下会出现不同的缺陷特征,根据不同缺陷的检测方法和采用的照明方式密切相关的特点,设计了光源二级照明系统及控制电路.此系统可随着对象检测的不同而采用对应的照明方式,不同缺陷在相对应照明方式下,可检测到对象的最优图像质量.控制电路既能在不同的环境中调节光源的亮度,又可单独调节需要重点突出某一缺陷部分的区域,达到了AOI检测系统对各种元件图像采集检测的要求.
A light source control circuit and secondary illumination system is designed in light the defects in the different illumination conditions. This system adopts corresponding illumination for various objects to detect the best picture quality. Both manual and automatic controls are available to adjust the brightness of the light source in different environments, with separated adjustment for highlighting the defective part of a focused region, thus meeting the requirements of AOI image capture detection of various components.
部分文件列表
| 文件名 | 大小 |
| AOI检测系统的光源照明模式和控制电路设计.pdf | 713K |
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