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集成电路RFID芯片测试系统设计与实现

更新时间：2020-08-11 06:22:20 大小：861K 上传用户：IC老兵查看TA发布的资源 标签：集成电路 rfid 下载积分：5分评价赚积分（如何评价?）收藏评论(0) 举报

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为了测试RFID集成电路芯片成品,设计了一种基于ISO14443A协议读写芯片的非接触式集成电路（RFID）芯片的功能测试系统.该测试系统完全采用国内自主产权设计的半自动测试台配置搭建测试,适合针对某一系列芯片研发的测试使用,避免了功能性冗余浪费.在测试方面,能够直接连接芯片的测试引脚,直接测试;也可以通过非接触式近距离感应耦合测试.工业使用结果表明：系统能够精准地测试RFID芯片性能,具有测试效率高、使用便捷的特点.

For FT（ finall test） of RFID integrated chip, a sub-product parameters and final functional test system was designed based on IS014443A protocol, for contactless integrated circuit （RFID） chip. This testing system used the semi-automatic test probe station and the testing system which with independence intelligent property right, as targeted for domestic companies＇ single serials IC research and development or testing applications, avoiding the waste of functional redundancy. For testing, it can directly be connected to the test pad of the chip, can also be coupled testing through the non-contact type proximity. Experimental and in- dustrial results show that it is satisfied with the requirements of precision, and had the merits...