推荐星级：
- 1
- 2
- 3
- 4
- 5
数字电路阈值故障测试生成算法
资料介绍
提出一种有效的数字电路故障阈值故障测试生成算法。首先构造出数字电路的阈值测试模型,通过这个模型可以区分出可接受故障和不可接受故障,然后使用成熟的固定故障测试生成算法得到不可接受故障的测试生成矢量。在ISCAS’85和ISCAS’89电路上的实验结果表明:该算法的故障覆盖率能达到96%,故障测试生成时间少于0. 019 s。
An effective faults test generation algorithm based on threshold for digital circuits is proposed in this paper. Firstly,digital circuit’s threshold test generation model is constructed,through which the acceptable fault and the unacceptable fault can be distinguished. Then the threshold test vectors can be obtained for unacceptable faults by using mature stuck-at faults test generation algorithm. The experimental results on the ISCAS’85 and ISCAS’89 circuits show that the fault coverage of the algorithm can reach up to 96% and the test generation time is less than 0. 1 second.
部分文件列表
| 文件名 | 大小 |
| 数字电路阈值故障测试生成算法.pdf | 666K |
全部评论(0)